Spectroscopy for Materials Characterization

13 Chapter 13Figure 13.1 UV photons‐stimulated photoemission and energy band diagram.Figure 13.2 Diagram of relations between work functions of sample and energy...Figure 13.3 The scheme displaying how to measure the width γ of UPS cal...Figure 13.4 Electronic band alignment scheme: Δ E Fand “vacuum shift” Δ meas...Figure 13.5 Angle‐resolved ultraviolet photoemission (ARUPS) scheme.Figure 13.6 Ion‐gun sputtering scheme of a sample surface.Figure 13.7 Dual‐channel charge neutralizer working scheme.Figure 13.8 Combined dual‐source charge neutralizer working scheme.

14 Chapter 14Figure 14.1 The main TEM‐related conventional electron spectroscopies are th...Figure 14.2 A schematic representation of electron energy loss spectrum. The...Figure 14.3 The electronic excitations involving “one‐electron like” transit...Figure 14.4 EELS spectra of diamond, graphite, and amorphous carbon core‐los...Figure 14.5 Comparison of near edge EELS (dotted line) and XANES (solid line...Figure 14.6 Core‐exciton peaks from an EELS spectrum at the carbon K‐edge fo...Figure 14.7 Plasmon dispersion in graphene and graphite depicted by EELS‐TEM...Figure 14.8 Vibrational EELS spectrum from g‐CN xH yaggregates recorded at 60...Figure 14.9 A schematic diagram showing how the 3D spectral map is built as ...Figure 14.10 Method for the extraction of quantitative compositional maps in...Figure 14.11 The localized surface plasmon resonance modes supported by a di...Figure 14.12 Schematic view of the focusing and acceleration lenses of a TEM...Figure 14.13 The insertion of a small diaphragm aperture allows the selectio...Figure 14.14 A simplified diagram to illustrate contrast generation in an en...Figure 14.15 Comparison between conventional (CTEM) and an in‐column integra...Figure 14.16 Element distribution images obtained with the three‐windows met...

15 Chapter 15Figure 15.1 Typical scheme of an AM‐AFM microscope.Figure 15.2 Schematic representation of (a) V‐shaped and (b) rectangle‐shape...Figure 15.3 (a) Z and X – Y piezo cylinders composing the segmented tube scann...Figure 15.4 Displacement of a piezoelectric actuator in response to increasi...Figure 15.5 Scheme of the four‐quadrants photodetector for three different g...Figure 15.6 Sphere–flat geometry approximately describing tip and surface ge...Figure 15.7 Qualitative representation of the interaction force between tip ...Figure 15.8 Cross‐sectional shape of meniscus at the interface of sphere and...Figure 15.9 Portions of the tip–force curve involved in Contact and Tapping ...Figure 15.10 (a) Schematic representation of the damped ideal point‐mass spr...Figure 15.11 Graphical representation of the deflection of the cantilever as...Figure 15.12 Graphical representation of the function A ( ω ) of Eq. (15.5...Figure 15.13 Representation of the effects induced by tip–sample interaction...Figure 15.14 (a) δ ( Z c) and (b) F ts( d ) curves for the idealized case o...Figure 15.15 Typical F ts( d ) curves obtained when the probe approaches (dash...Figure 15.16 (a) 2 μm × 2 μm AFM image of the SiO 2sample surface obtained a...Figure 15.17 (a) 1 μm × 1 μm AFM image of the system consisting of latex nan...Figure 15.18 Size distribution of the nanoparticle's diameter estimated by A...

1 Cover Page

2 Title Page

3 Copyright Page

4 Preface

5 List of Contributors

6 Table of Contents

7 Begin Reading

8 Index

9 Wiley End User License Agreement

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