Joel P. Dunsmore - Handbook of Microwave Component Measurements

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Library of Congress Cataloging‐in‐Publication Data

Names: Dunsmore, Joel P., author.

Title: Handbook of microwave component measurements : with advanced VNA techniques / Joel P. Dunsmore.

Description: Second edition. | Hoboken, NJ : John Wiley & Sons, Inc.,

[2020] | Includes bibliographical references and index.

Identifiers: LCCN 2020003649 (print) | LCCN 2020003650 (ebook) | ISBN

9781119477136 (hardback) | ISBN 9781119477112 (adobe pdf) | ISBN 9781119477129 (epub)

Subjects: LCSH: Microwave devices–Testing.

Classification: LCC TK7876 .D84 2020 (print) | LCC TK7876 (ebook) | DDC 621.381/330287–dc23

LC record available at https://lccn.loc.gov/2020003649

LC ebook record available at https://lccn.loc.gov/2020003650

Cover design: Wiley

Cover image: Created by Joel Dunsmore, © Tuomas Lehtinen/Getty Images

To my dear wife Dana

Our world today is perpetually changing due to advancements in technology. As we begin the new decade, we are on the verge of large‐scale 5G deployments that will enable richer services across more devices while driving higher performance across the entire network, from the device to the edge to the core. Automotive capabilities are continuing the march toward progressively higher levels of autonomy. The number of connected devices being deployed in our homes, businesses, and cities, including devices we carry or wear, is growing exponentially. These are just a few of the changes that technology is enabling, and they will lead to further changes and innovations. The pace of change and the associated level of technological complexity are only accelerating. As has long been true with technology innovation, practical advancements in technology are possible only with corresponding advancements in measurement. Measurement helps confirm the creation of a new technology in the first place and later helps in applying and disseminating the technology with the required levels of performance, quality, and cost.

The measurement challenges with today's new technologies increasingly require total solutions. Traditional hardware measurement instruments are no longer enough. Of course, state‐of‐the‐art hardware is still required, but significant software capabilities that build on the core capabilities of the hardware are equally vital. Complex calibrations, advanced measurement algorithms, and sophisticated data analysis and visualization allow the raw measurement data to be turned into useful information that yields actionable insights. This is especially the case with microwave measurements, including measurements of microwave components based on vector network analyzer solutions.

It's also the case that no one measurement solution fits all. Different form factors are preferred for different use cases. Benchtop instruments are often used in laboratory or product development settings. Modular solutions, with their density and configuration flexibility, can be appropriate for manufacturing. Portable, handheld solutions are required in field environments. Still other formats are useful for experimental or educational purposes. Sometimes the software is best executed within the measurement instrument, and sometimes it is preferred that it run elsewhere, on a desktop computer or even on computing resources located in the cloud.

In this second edition of his comprehensive book, Dr. Joel Dunsmore has refined the already strong original presentation of the foundational concepts of microwave component measurements, while adding important new material on modulated measurements and on the use of modular instruments. Other additions cover the increased importance of calibration and metrology in the context of 5G measurement challenges. Throughout, the value of understanding the measurement science – how the calculations are made and why – is conveyed in a compelling way. Dr. Dunsmore can do all this effectively because of his now nearly four decades of experience as an innovative practitioner and educator, making advanced measurement ideas real through new products and solutions and sharing those ideas with others. This book is the latest example of applying his talents to help move forward the technologies that connect and secure today's perpetually changing world.

Ron Nersesian

Chairman and CEO, Keysight Technologies

The electronics industry has undergone revolutionary changes in the past 20 years. System performance has significantly advanced, physical size of hardware has shrunk, quality and reliability have greatly improved and manufacturing costs have dramatically decreased. Underlying these advances has been the phenomenal growth in RF test and measurement capability. Modern‐day RF test equipment has progressed to the point where it is not uncommon to measure signals below −100 dBm at milliseconds speed. Even more astounding is the ability to marry RF test capability with analysis software whereby test equipment can produce linear and non‐linear models of the device under test to significantly improve the life of the design engineer, using this capability.

RF and microwave components have played an important role in this revolutionary change. Component size has shrunk, parasitics have been reduced, quality standards have greatly improved and costs have reduced ten‐fold. At the same time, test fixtures and interconnects have improved to enable a higher level of precision during characterization and production measurement. In parallel with these advances, test equipment has improved to an extent where there has been a revolution in the capabilities to make precise and fast measurements of RF and microwave components. The success of a manufacturer of RF and microwave components is directly linked to the quality and capability of measuring component performance during the design, qualification and production phase of the product life cycle. From a practical point of view, the testing must be fast (1–2 seconds), the accuracy very precise (hundredths of a dB), with a high degree of repeatability. Each phase of the life cycle imposes its unique requirements for measurement accuracy and data collection.