Stephen Rolt - Optical Engineering Science

18 Chapter 18Figure 18.1 Concurrent engineering – ‘Closing the Loop’.Figure 18.2 Subsystem partitioning of requirements.Figure 18.3 Design process.Figure 18.4 Design tools.Figure 18.5 Doublet wavefront error vs field angle (before optimisation).Figure 18.6 Doublet ray trace plot.Figure 18.7 Doublet wavefront error vs field angle (after optimisation).Figure 18.8 Monte Carlo simulation of tolerancing for simple doublet.Figure 18.9 Tolerancing process.Figure 18.10 Revised Monte Carlo simulation of tolerancing for simple doublet....Figure 18.11 Mechanical tolerances in a simple spherical single lens.Figure 18.12 Model for microscope illumination system.Figure 18.13 Microscope illumination – irradiance uniformity.Figure 18.14 Relative irradiance across illuminated area.Figure 18.15 Baffling effect of lens tube.Figure 18.16 Lens hood and additional baffling.

19 Chapter 19Figure 19.1 Uniform shear forces acting on an element.Figure 19.2 Flexure of optical bench under load.Figure 19.3 Flexure in a beam element.Figure 19.4 Force and bending moment in a cantilever.Figure 19.5 Forces acting on single beam element.Figure 19.6 Beam deflection due to self-weight.Figure 19.7 Generalised illustration of optical bench distortion.Figure 19.8 Self-deflection induced aberration in fused silica mirror.Figure 19.9 Impact of vacuum window deformation.Figure 19.10 Mirror supported by a ring mount.Figure 19.11 Impact of support ring position on mirror deflection.Figure 19.12 (a) Mirror vee block support (b) Mirror belt support.Figure 19.13 Lens mounting in a lens barrel.Figure 19.14 Composite optical bench.Figure 19.15 Compliance of radiused retainer.Figure 19.16 Simple rectangular mesh.Figure 19.17 Meshing structure for simple barrel-mounted lens.

20 Chapter 20Figure 20.1 The generation of spherical surfaces by grinding.Figure 20.2 Typical grinding process for single piece.Figure 20.3 Blocking process.Figure 20.4 Subsurface damage following grinding.Figure 20.5 Polishing process (for spherical components).Figure 20.6 Continuous lap polishing of flats.Figure 20.7 Test plate interferogram.Figure 20.8 Simplified process flow for grinding and polishing.Figure 20.9 Relative cost vs form accuracy.Figure 20.10 Subaperture polishing process.Figure 20.11 Magneto-rheological polishing.Figure 20.12 Ion beam figuring.Figure 20.13 Five axis diamond machining tool.Figure 20.14 Single point diamond turning process.Figure 20.15 Surface texture generated during single point diamond machining....Figure 20.16 Raster flycutting.Figure 20.17 Replication of micro-optics. (a) Mould application (b) Pressing ( ...Figure 20.18 Lens edging in a bell chuck.Figure 20.19 Lens centring in a chuck.Figure 20.20 Bonding of doublets.Figure 20.21 PSD spectra for polished and diamond machined components.Figure 20.22 Designation for surface texture.Figure 20.23 Example drawing. *P4 designates a polished surface whose quality ...

21 Chapter 21Figure 21.1 Schematic diagram of lens barrel mounting.Figure 21.2 Active lens centring.Figure 21.3 Kinematic constraints.Figure 21.4 Kinematic mount example.Figure 21.5 Gimbal mechanism.Figure 21.6 Mirror mount with flexures.Figure 21.7 Example of a hexapod mount.Figure 21.8 General layout of a linear stage.Figure 21.9 Types of linear slide.Figure 21.10 Inchworm piezoelectric drive.Figure 21.11 Isostatic mounting arrangement.Figure 21.12 Flexure linkages.Figure 21.13 Hindle mount.Figure 21.14 Transmission spectrum for acrylic adhesive (Norland NOA 61).Figure 21.15 Opto-electronic component bonding and alignment.Figure 21.16 Simple laboratory alignment process.Figure 21.17 Principle of autocollimator.Figure 21.18 Use of interferometer or autocollimator in co-alignment of plane ...Figure 21.19 Spot centroiding.Figure 21.20 Alignment process with beamsplitter.Figure 21.21 Double pass interferometry.Figure 21.22 Cleanliness levels according to IEST-STD-CC1246D.Figure 21.23 Impact of surface contamination on scattering.

22 Chapter 22Figure 22.1 Background vibration levels in some environments.Figure 22.2 Vibration transmission for a typical passive isolation system.Figure 22.3 Typical transport environment vibrational load.Figure 22.4 Temperature cycling profile for NIRSPEC integral field unit (IFU) ...Figure 22.5 Focal length determination with precision collimator.Figure 22.6 Nodal point location.Figure 22.7 Nodal slide arrangement.Figure 22.8 Interferometric measurement of focal length.Figure 22.9 Interferometric measurement of focal length with axial adjustment....Figure 22.10 Schematic of linear encoder.Figure 22.11 Goniometer arrangement.Figure 22.12 Precision angle measurement of prisms by interferometry.Figure 22.13 Detector flat fielding.Figure 22.14 Measurement of spectral irradiance.Figure 22.15 Silicon photodiode temperature sensitivity vs. wavelength.Figure 22.16 Layout of spectrophotometer.Figure 22.17 Measurement of birefringence and stress-induced birefringence.Figure 22.18 Measurement of refractive index through minimum deviation.

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