Anthony Kelly - Crystallography and Crystal Defects

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The classic book that presents a unified approach to crystallography and the defects found within crystals, revised and updated This new edition of
explains the modern concepts of crystallography in a clear, succinct manner and shows how to apply these concepts in the analyses of point, line and planar defects in crystalline materials. 
Fully revised and updated, this book now includes:
Original source references to key crystallographic terms familiar to materials scientists Expanded discussion on the elasticity of cubic materials New content on texture that contains more detail on Euler angles, orientation distribution functions and an expanded discussion on examples of textures in engineering materials Additional content on dislocations in materials of symmetry lower than cubic An expanded discussion of twinning which includes the description and classification of growth twins The inclusion and explanation of results from atomistic modelling of twin boundaries Problem sets with new questions, detailed worked solutions, supplementary lecture material and online computer programs for crystallographic calculations. Written by authors with extensive lecturing experience at undergraduate level,
continues to take its place as the core text on the topic and provides the essential resource for students and researchers in metallurgy, materials science, physics, chemistry, electrical, civil and mechanical engineering.

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Crystallography and Crystal Defects

Third Edition

ANTHONY KELLY and KEVIN M. KNOWLES

Department of Materials Science & Metallurgy University of Cambridge UK

Copyright This edition first published 2020 2020 John Wiley Sons Ltd - фото 20

Copyright

This edition first published 2020

© 2020 John Wiley & Sons Ltd

Edition History

John Wiley & Sons (1e, 2000)

John Wiley & Sons (2e, 2012)

All rights reserved. No part of this publication may be reproduced, stored in a retrieval system, or transmitted, in any form or by any means, electronic, mechanical, photocopying, recording or otherwise, except as permitted by law. Advice on how to obtain permission to reuse material from this title is available at http://www.wiley.com/go/permissions.

The right of Anthony Kelly and Kevin M. Knowles be identified as the authors of this work has been asserted in accordance with law.

Registered Offices

John Wiley & Sons, Inc., 111 River Street, Hoboken, NJ 07030, USA

John Wiley & Sons Ltd, The Atrium, Southern Gate, Chichester, West Sussex, PO19 8SQ, UK

Editorial Office

The Atrium, Southern Gate, Chichester, West Sussex, PO19 8SQ, UK

For details of our global editorial offices, customer services, and more information about Wiley products visit us at www.wiley.com.

Wiley also publishes its books in a variety of electronic formats and by print‐on‐demand. Some content that appears in standard print versions of this book may not be available in other formats.

Limit of Liability/Disclaimer of Warranty

In view of ongoing research, equipment modifications, changes in governmental regulations, and the constant flow of information relating to the use of experimental reagents, equipment, and devices, the reader is urged to review and evaluate the information provided in the package insert or instructions for each chemical, piece of equipment, reagent, or device for, among other things, any changes in the instructions or indication of usage and for added warnings and precautions. While the publisher and authors have used their best efforts in preparing this work, they make no representations or warranties with respect to the accuracy or completeness of the contents of this work and specifically disclaim all warranties, including without limitation any implied warranties of merchantability or fitness for a particular purpose. No warranty may be created or extended by sales representatives, written sales materials or promotional statements for this work. The fact that an organization, website, or product is referred to in this work as a citation and/or potential source of further information does not mean that the publisher and authors endorse the information or services the organization, website, or product may provide or recommendations it may make. This work is sold with the understanding that the publisher is not engaged in rendering professional services. The advice and strategies contained herein may not be suitable for your situation. You should consult with a specialist where appropriate. Further, readers should be aware that websites listed in this work may have changed or disappeared between when this work was written and when it is read. Neither the publisher nor authors shall be liable for any loss of profit or any other commercial damages, including but not limited to special, incidental, consequential, or other damages.

Library of Congress Cataloging‐in‐Publication Data

Names: Kelly, A. (Anthony), author. | Knowles, Kevin M., author.

Title: Crystallography and crystal defects / Anthony Kelly

(University of Cambridge), Kevin M. Knowles (University of

Cambridge).

Description: Third edition. | Hoboken, NJ : John Wiley & Sons, 2020. |

Includes bibliographical references and index.

Identifiers: LCCN 2019035382 (print) | LCCN 2019035383 (ebook) | ISBN

9781119420170 (hardback) | ISBN 9781119420156 (adobe pdf) | ISBN

9781119420163 (epub)

Subjects: LCSH: Crystallography. | Crystals–Defects.

Classification: LCC QD931 .K4 2020 (print) | LCC QD931 (ebook) | DDC

548/.8–dc23

LC record available at https://lccn.loc.gov/2019035382

LC ebook record available at https://lccn.loc.gov/2019035383

Cover Design: Wiley

Cover Image: Courtesy of Kevin M. Knowles, © oxygen/Getty Images

Preface to the Third Edition

While there are a plethora of books devoted to crystallography and, in particular, X‐ray crystallography and electron crystallography of varying levels of sophistication, ranging from undergraduate primers to advanced research level texts, there is still no other textbook which cover the topics of crystallography and crystal defects in as integrated and complete a manner as previous editions of this book. As a consequence, unless there is one of these previous editions to hand, or, better still, this new edition, students and researchers interested in crystallography and crystal defects will have to have one or more sources for their crystallography, and one or more sources for their understanding of defects in crystalline materials and how the microscopic behaviour of the movement of dislocations or formation of twins leads to macroscopic plasticity in crystalline materials.

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