Abdelkhalak El Hami - Applications and Metrology at Nanometer Scale 1

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To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics. <p>This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications. <p>Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master's students.

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Figure 4.5. Surface polarization of quartz under mechanical strain Figure 4.6. The various displacements of the translational vector u(r) in a mate...Figure 4.7. Stress tensor σ ik corresponding to the component k of the force F pe... Figure 4.8. Octahedral and dodecahedral sites of CaTiO3 perovskite with ABO3 str...Figure 4.9. Poling of a ferroelectric material. For a color version of this figu...Figure 4.10. Shape memory alloy development process Figure 4.11. Displacement vectors to calculate the strain tensor in 2D Figure 4.12. Diagram of a piezoelectric accelerometer Figure 4.13. Diagram of a piezoelectric transducer Figure 4.14. Piezoelectric layer Figure 4.15. a) Zero forces and b) zero strain Figure 4.16. a) Piezoelectric sensor and b) piezoelectric layer Figure 4.17. Piezoelectric double layer Figure 4.18. a) Piezoelectric double layer and b) bending of layers Figure A.1. Kirchhoff’s integral over a surface Σ passing through a point M surr...Figure A.2. Diagram of diffraction in a plane containing P through a slit contai...Figure A.3. Distribution of the diffraction amplitude through a circular hole. F...

List of Tables

1 Chapter 2Table 2.1. Parameters of the mass–spring–shock absorber system model

2 Chapter 4Table 4.1. Smart materials for sensors and actuators Table 4.2. Correspondence for contracting indices Ciklm to Cik Table 4.3. Correspondence for contracting indices Ciklm to Cik Table 4.4. Fundamental laws for linear electromagnetic media Table 4.5. Correspondence for contracting the indices from dikl to dik Table 4.6. Piezoelectric effect in tensor and matrix notation Table 4.7. Orders of magnitude of the characteristics of some active materials Table 4.8. The point groups of 32 classes of symmetry and the equivalence betwee...Table 4.9. Schoenflies and Hermann–Mauguin notation

Guide

1 Cover

2 Title page Reliability of Multiphysical Systems Set coordinated by Abdelkhalak El Hami Volume 9

3 Copyright First published 2021 in Great Britain and the United States by ISTE Ltd and John Wiley & Sons, Inc. Apart from any fair dealing for the purposes of research or private study, or criticism or review, as permitted under the Copyright, Designs and Patents Act 1988, this publication may only be reproduced, stored or transmitted, in any form or by any means, with the prior permission in writing of the publishers, or in the case of reprographic reproduction in accordance with the terms and licenses issued by the CLA. Enquiries concerning reproduction outside these terms should be sent to the publishers at the undermentioned address: ISTE Ltd 27-37 St George’s Road London SW19 4EU UK www.iste.co.uk John Wiley & Sons, Inc. 111 River Street Hoboken, NJ 07030 USA www.wiley.com © ISTE Ltd 2021 The rights of Pierre-Richard Dahoo, Philippe Pougnet and Abdelkhalak El Hami to be identified as the authors of this work have been asserted by them in accordance with the Copyright, Designs and Patents Act 1988. Library of Congress Control Number: 2020946679 British Library Cataloguing-in-Publication Data A CIP record for this book is available from the British Library ISBN 978-1-78630-640-1

4 Preface

5 Introduction

6 Begin Reading

7 Appendix

8 References

9 Index

10 End User License Agreement

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Reliability of Multiphysical Systems Set

coordinated by

Abdelkhalak El Hami

Volume 9

Applications and Metrology at Nanometer Scale 1

Smart Materials, Electromagnetic Waves and Uncertainties

Pierre-Richard Dahoo

Philippe Pougnet

Abdelkhalak El Hami

First published 2021 in Great Britain and the United States by ISTE Ltd and - фото 1

First published 2021 in Great Britain and the United States by ISTE Ltd and John Wiley & Sons, Inc.

Apart from any fair dealing for the purposes of research or private study, or criticism or review, as permitted under the Copyright, Designs and Patents Act 1988, this publication may only be reproduced, stored or transmitted, in any form or by any means, with the prior permission in writing of the publishers, or in the case of reprographic reproduction in accordance with the terms and licenses issued by the CLA. Enquiries concerning reproduction outside these terms should be sent to the publishers at the undermentioned address:

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