Abdelkhalak El Hami - Applications and Metrology at Nanometer-Scale 2

..Figure 4.19. a) A laminate structure; b) types of laminates. For a color version...Figure 4.20. Main steps of the optimization process of a PCB. For a color versio...Figure 4.21. PCB cross-section and finite element mesh. For a color version of t...Figure 4.22. Iso-surfaces of the effects of the volume ratio and the fiber orien...Figure 4.23. Evolution of the orientation angle (a) and the volume ratio of fibe...Figure 4.24. Evolution of the ratio between the thickness of FR4 and the copper ...Figure 4.25. Load exerted on a thin-film SWCNT structure as a function of the di...Figure 4.26. Finite element model of the indenter–film system. For a color versi...Figure 4.27. Results of testing and modeling the load of a thin-film SWCNT struc...Figure 4.28. Stress distribution of the film-substrate SWCNT system. For a color...Figure 4.29. Effects of different forms of indenter on the load–displacement cur...Figure 4.30. Effect of the thickness of the SWCNT structure on the load–displace...Figure 4.31. Effect of the Young modulus of the substrate on the load–displaceme...Figure 4.32. Load-displacement curves from testing and modeling. For a color ver...Figure 4.33. Experimental and simulated discharge curves. For a color version of...

1 Chapter 3Table 3.1. Action of the H gate on the states of a qubit Table 3.2. Action of the CNOT gate on a two-qubit register Table 3.3. Action of the control phase gate CΦ on a two-qubit register

2 Chapter 4Table 4.1. RBDO results for a calculation before and after condensing the model Table 4.2. DDO and RBDO results Table 4.3. RBDO results for a calculation before and after model condensation Table 4.4. Initial parameters Table 4.5. DDO results for a safety factor of 1.5 Table 4.6. DDO results for a safety factor of 1.2 Table 4.7. DDO results for a safety factor of 1.1 Table 4.8. Comparison of the results obtained by the DDO method for the various ...Table 4.9. RBDO results Table 4.10. Results of the RBDO method for several limit states Table 4.11. Values of the parameters used for numerical simulations Table 4.12. Values of the parameters used in the genetic algorithm Table 4.13. Optimal values of PCB design variables Table 4.14. Results Of finite element simulations

1 Cover

2 Table of Contents

3 Title Page Reliability of Multiphysical Systems Set coordinated by Abdelkhalak El Hami Volume 10

4 Copyright First published 2021 in Great Britain and the United States by ISTE Ltd and John Wiley & Sons, Inc. Apart from any fair dealing for the purposes of research or private study, or criticism or review, as permitted under the Copyright, Designs and Patents Act 1988, this publication may only be reproduced, stored or transmitted, in any form or by any means, with the prior permission in writing of the publishers, or in the case of reprographic reproduction in accordance with the terms and licenses issued by the CLA. Enquiries concerning reproduction outside these terms should be sent to the publishers at the undermentioned address: ISTE Ltd 27-37 St George’s Road London SW19 4EU UK www.iste.co.uk John Wiley & Sons, Inc. 111 River Street Hoboken, NJ 07030 USA www.wiley.com © ISTE Ltd 2021 The rights of Pierre-Richard Dahoo, Philippe Pougnet and Abdelkhalak El Hami to be identified as the authors of this work have been asserted by them in accordance with the Copyright, Designs and Patents Act 1988. Library of Congress Control Number: 2020950471 British Library Cataloguing-in-Publication Data A CIP record for this book is available from the British Library ISBN 978-1-78630-687-6

5 Preface

6 Introduction

7 Begin Reading

8 Appendix: Short Overview of Quantum Mechanics

9 References

10 Index

11 End User License Agreement

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Reliability of Multiphysical Systems Set

coordinated by

Abdelkhalak El Hami

Volume 10

Pierre Richard Dahoo

Philippe Pougnet

Abdelkhalak El Hami

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