Narayanaswamy Balakrishnan - Accelerated Life Testing of One-shot Devices

1 Cover Page

2 Chapter 1 Accelerated Life Testing of One‐shot Devices

3 Table of Contents

4 Begin Reading

5 Author Index

6 Subject Index

7 WILEY END USER LICENSE AGREEMENT

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Data Collection And Analysis

Narayanaswamy Balakrishnan

McMaster University

Hamilton, Canada

Man Ho Ling

The Education University of Hong Kong

Tai Po, Hong Kong

Hon Yiu So

University of Waterloo

Waterloo, Canada

This first edition first published 2021

© 2021 by John Wiley and Sons, Inc.

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The right of Narayanaswamy Balakrishnan, Man Ho Ling, and Hon Yiu So to be identified as the author(s) of this work has been asserted in accordance with law.

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Library of Congress Cataloging‐in‐Publication Data

Names: Balakrishnan, Narayanaswamy., 1956‐ author. | Ling, Man Ho, author. | So, Hon

Yiu, author.

Title: Accelerated life testing of one‐shot devices : data collection and

analysis / Narayanaswamy Balakrishnan, McMaster University, Hamilton,

Canada, Man Ho Ling, The Education University of Hong, Kong, New

Territories, Hong Kong, Hon Yiu So, University of Waterloo, Waterloo,

Canada.

Description: First edition. | Hoboken, NJ, USA : Wiley, 2021. | Includes

bibliographical references and index.

Identifiers: LCCN 2020035725 (print) | LCCN 2020035726 (ebook) | ISBN

9781119664000 (cloth) | ISBN 9781119664017 (adobe pdf) | ISBN

9781119663942 (epub)

Subjects: LCSH: Accelerated life testing. | Failure analysis (Engineering)

Classification: LCC TA169.3 .B35 2021 (print) | LCC TA169.3 (ebook) | DDC

620/.00452–dc23

LC record available at https://lccn.loc.gov/2020035725

LC ebook record available at https://lccn.loc.gov/2020035726

Cover Design: Wiley

Cover Image: © Piergiov/Getty Images

With great love and affection, we dedicate this book to

Sarah and Julia Balakrishnan, and Colleen Cutler NB

Grace Chu, Sophia Ling, and Sheldon Ling MHL

Tian Feng and Victoria So HYS

Lifetime information obtained from one‐shot devices is very limited as the entire data are either left‐ or right‐censored. For this reason, the analysis of one‐shot device testing data poses a special challenge. This book provides several statistical inferential methods for analyzing one‐shot device lifetime data obtained from accelerated life‐tests and also develops optimal designs for two mainstream accelerated life‐tests – constant‐stress and step‐stress accelerated life‐tests – that are commonly used in reliability practice. The discussions provided in the book would enable reliability practitioners to better design their experiments for data collection from efficient accelerated life‐tests when there are budget constraints in place. This is important from estimation and prediction point of view as such optimal designs would result in as accurate an inference as possible under the constraints imposed on the reliability experiment. Moreover, R codes are presented within each chapter so that users can try out performing their own analysis on one‐shot device testing data.