Narayanaswamy Balakrishnan - Accelerated Life Testing of One-shot Devices

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Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot devices—electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once—poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests.
Accelerated Life Testing of One-shot Devices: Data Collection and Analysis Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-tests Discusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraints Helps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practice Includes R code in each chapter for readers to use in their own analyses of one-shot device testing data Features numerous case studies and practical examples throughout Highlights important issues, problems, and future research directions in reliability theory and practice
is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.

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5 Chapter 5Table 5.1 Null and alternative hypotheses for exponential, gamma, and Weibull...Table 5.2 R codes for computing WMDPDEs and Wald‐type test statistic values f...Table 5.3 The WMDPDEs of model parameters, reliability at various mission times,Table 5.4 The WMDPDEs of model parameters, reliability at various mission times,Table 5.5 The WMDPDEs of model parameters, reliability at various mission times,

6 Chapter 6Table 6.1 CSALTs with картинка 11test groups and картинка 12inspection times for one‐shot device...Table 6.2 Bias, RMSEs, coverage probabilities, and average widths of картинка 13confide...Table 6.3 Power analysis of distance‐based test statistic картинка 14for testing the pr...Table 6.4 R codes for point estimation and 95% asymptotic/approximate confide...Table 6.5 R outputs for inference on model parameters based on mice tumor tox...Table 6.6 R outputs for inference on the probability of female mice ( картинка 15) recei...

7 Chapter 7Table 7.1 R codes for optimal CSALTs subject to a budget of $200 000 and term...Table 7.2 R codes for optimal CSALTs subject to the limit of standard deviati...Table 7.3 Optimal CSALTs with different termination times and under different...Table 7.4 Optimal CSALTs with different termination times and under different...Table 7.5 Optimal CSALTs with different standard deviations, картинка 16, of the reliabi...Table 7.6 Optimal CSALTs with two stress factors for one‐shot devices under d...Table 7.7 Sensitivity analysis of optimal CSALTs under various combinations o...Table 7.8 Sensitivity analysis of optimal CSALTs under various combinations of p...Table 7.9 Sensitivity analysis of optimal CSALTs under various combinations o...

8 Chapter 8Table 8.1 One‐shot device testing data under SSALTs with two stress levels.Table 8.2 R codes for optimal SSALTs for the exponential distribution.Table 8.3 Optimal designs of SSALTs for electro‐explosive devices with parame...Table 8.4 Sensitivity analysis of the choice of values картинка 17with small картинка 18/moderate...Table 8.5 R codes for optimal SSALTs for the Weibull distribution.Table 8.6 Optimal designs for G‐MRFs (Zheng et al., 2018) to estimate the rel...Table 8.7 Optimal designs with fixed картинка 19and limit on standard deviation of 0.05...Table 8.8 Optimal designs with fixed картинка 20and limit on standard deviation of 0.01...Table 8.9 Optimal designs with fixed картинка 21and limit on standard deviation of 0.05...Table 8.10 Optimal designs with fixed Accelerated Life Testing of Oneshot Devices - изображение 22and limit on standard deviation of 0.0...Table 8.11 Sensitivity analysis of the choice of parameter values Accelerated Life Testing of Oneshot Devices - изображение 23with small...Table 8.12 Sensitivity analysis of the choice of parameter values Accelerated Life Testing of Oneshot Devices - изображение 24with small...

9 Chapter 9Table 9.1 One‐shot device testing data collected from CSALTs with картинка 25test group...Table 9.2 The conditional expectations for different cases (without masked da...Table 9.3 The conditional expectations of missing data for different cases (w...Table 9.4 The explicit expectations of Accelerated Life Testing of Oneshot Devices - изображение 26, and картинка 27for different cases (without m...Table 9.5 Parameter values for exponential lifetime distribution used in the ...Table 9.6 Bias of the estimates of parameters for devices with two competing ...Table 9.7 RMSE of the estimates of parameters for devices with two competing ...Table 9.8 Bias of the estimates of parameters for devices with two competing ...Table 9.9 RMSE of the estimates of parameters for devices with two competing ...Table 9.10 Parameter values for Weibull lifetime distribution used in the sim...Table 9.11 Bias and RMSE of the estimates of parameters for devices with two ...Table 9.12 R codes for defining ED01 experiment data with two causes of death...Table 9.13 The values of the hyperparameters for Laplace, normal, and Dirichl...Table 9.14 The modified data from Table 1.6 with masked cause of death.Table 9.15 R codes for the estimation of model parameters, mean lifetime, and...Table 9.16 R codes for the estimation for competing risks model underexponent...Table 9.17 R outputs for ED01 experiment data in Table 1.6 and 9.14 for compe...Table 9.18 R codes for the estimation for competing risks model under Weibull...Table 9.19 R outputs for ED01 experiment data in Table 1.6 and the modified d...

10 Chapter 10Table 10.1 Form of one‐shot device testing data with two failure modes.Table 10.2 Bias and root mean square error (RMSE) of the QMLEs of parameters Accelerated Life Testing of Oneshot Devices - изображение 28Table 10.3 Bias and root mean square error (RMSE) of the QMLEs of parameters Accelerated Life Testing of Oneshot Devices - изображение 29Table 10.4 R codes for defining the data with two correlated disease categori...Table 10.5 R codes for the estimation of model parameters under Gumbel–Hougaa...Table 10.6 QMLEs and 95% percentile bootstrap confidence intervals of paramet...Table 10.7 Estimates of the probabilities of absence of disease category (a),...

List of Illustrations

1 Chapter 2Figure 2.1 Histograms of the MLEs (first row), along with log/logit (second ...Figure 2.2 Histograms of the MLEs (first row), along with log/logit (second ...Figure 2.3 Histograms of the MLEs (first row), along with log/logit (second ...Figure 2.4 Histograms of the MLEs (first row), along with log/logit (second ...

2 Chapter 5Figure 5.1 RMSE of the WMDPDE of картинка 30as well as the significance level and the...Figure 5.2 RMSE of the WMDPDE of картинка 31as well as the significance lev...Figure 5.3 RMSE of the WMDPDE of картинка 32as well as the significance level and the...

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